Design and construction of a new chamber for measuring the thickness of alpha-particle sources

Resumen

The thickness of charged-particle emitting sources can be determined by varying the incidence angle of particles using silicon semiconductor detectors. The differences in energy between the peaks for an alpha emission measured with different incident angles are due to the energy loss of alpha particles in the source. These shifts can thus be used to estimate the source thickness. A new detection chamber has been constructed for this purpose. Its advantage is the registration of the alpha particles emitted from a given source using up to three different detectors simultaneously. Monte Carlo simulation was used to help to determine the best measurement conditions and interpret the results.

Alfonso Fernandez Timon

Profesor Titular de Universidad

Alfonso Fernández Timón es Profesor Titular de Universidad y unos de los investigadores seniors del Grupo de Investigación en Algoritmos de Optimización GRAFO de la Universidad Rey Juan Carlos. Anteriormente fue Becario de la Red de Estaciones Metrológicas y del Plan de Vigilancia Radiológica del CSN en la Universidad de Extremadura. Sus lineas de investigación abarcan desde la aplicación de metaheurísticas para resolver problemas de optimización combinatoria hasta la metrología de radiaciones nucleares.